@inproceedings{DBLP:conf/isscc/MeterelliyozGKR10,
author = {Mesut Meterelliyoz and
Ashish Goel and
Jaydeep P. Kulkarni and
Kaushik Roy},
title = {Accurate characterization of random process variations using
a robust low-voltage high-sensitivity sensor featuring replica-bias
circuit},
booktitle = {ISSCC},
year = {2010},
pages = {186-187},
ee = {http://dx.doi.org/10.1109/ISSCC.2010.5433991},
crossref = {DBLP:conf/isscc/2010},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isscc/2010,
title = {IEEE International Solid-State Circuits Conference, ISSCC
2010, Digest of Technical Papers, San Francisco, CA, USA,
7-11 February, 2010},
booktitle = {ISSCC},
publisher = {IEEE},
year = {2010},
isbn = {978-1-4244-6033-5},
ee = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5428240},
bibsource = {DBLP, http://dblp.uni-trier.de}
}