BibTeX record conf/isscc/LeeKKKKPKKPSCKK14

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@inproceedings{DBLP:conf/isscc/LeeKKKKPKKPSCKK14,
  author       = {Dong{-}Uk Lee and
                  Kyung Whan Kim and
                  Kwan{-}Weon Kim and
                  Hongjung Kim and
                  Ju Young Kim and
                  Young Jun Park and
                  Jae Hwan Kim and
                  Dae Suk Kim and
                  Heat Bit Park and
                  Jin Wook Shin and
                  Jang Hwan Cho and
                  Ki Hun Kwon and
                  Min Jeong Kim and
                  Jaejin Lee and
                  Kunwoo Park and
                  Byong{-}Tae Chung and
                  Sung{-}Joo Hong},
  title        = {25.2 {A} 1.2V 8Gb 8-channel 128GB/s high-bandwidth memory {(HBM)}
                  stacked {DRAM} with effective microbump {I/O} test methods using 29nm
                  process and {TSV}},
  booktitle    = {2014 {IEEE} International Conference on Solid-State Circuits Conference,
                  {ISSCC} 2014, Digest of Technical Papers, San Francisco, CA, USA,
                  February 9-13, 2014},
  pages        = {432--433},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISSCC.2014.6757501},
  doi          = {10.1109/ISSCC.2014.6757501},
  timestamp    = {Mon, 09 Aug 2021 14:54:04 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/LeeKKKKPKKPSCKK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}