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BibTeX record conf/isscc/LeeKKKKPKKPSCKK14
@inproceedings{DBLP:conf/isscc/LeeKKKKPKKPSCKK14, author = {Dong{-}Uk Lee and Kyung Whan Kim and Kwan{-}Weon Kim and Hongjung Kim and Ju Young Kim and Young Jun Park and Jae Hwan Kim and Dae Suk Kim and Heat Bit Park and Jin Wook Shin and Jang Hwan Cho and Ki Hun Kwon and Min Jeong Kim and Jaejin Lee and Kunwoo Park and Byong{-}Tae Chung and Sung{-}Joo Hong}, title = {25.2 {A} 1.2V 8Gb 8-channel 128GB/s high-bandwidth memory {(HBM)} stacked {DRAM} with effective microbump {I/O} test methods using 29nm process and {TSV}}, booktitle = {2014 {IEEE} International Conference on Solid-State Circuits Conference, {ISSCC} 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014}, pages = {432--433}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ISSCC.2014.6757501}, doi = {10.1109/ISSCC.2014.6757501}, timestamp = {Mon, 09 Aug 2021 14:54:04 +0200}, biburl = {https://dblp.org/rec/conf/isscc/LeeKKKKPKKPSCKK14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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