BibTeX record conf/isscc/KarpinskyyLCKNL16

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@inproceedings{DBLP:conf/isscc/KarpinskyyLCKNL16,
  author       = {Bohdan Karpinskyy and
                  Yongki Lee and
                  Yunhyeok Choi and
                  Yongsoo Kim and
                  Mijung Noh and
                  Sanghyun Lee},
  title        = {8.7 Physically unclonable function for secure key generation with
                  a key error rate of 2E-38 in 45nm smart-card chips},
  booktitle    = {2016 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2016, San Francisco, CA, USA, January 31 - February 4, 2016},
  pages        = {158--160},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ISSCC.2016.7417955},
  doi          = {10.1109/ISSCC.2016.7417955},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/KarpinskyyLCKNL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}