A new low power test pattern generator using a variable-length ring counter.

Bin Zhou Yizheng Ye Zhao-lin Li Xin-chun Wu Rui Ke A new low power test pattern generator using a variable-length ring counter. 248-252 2009 ISQED http://dx.doi.org/10.1109/ISQED.2009.4810302 conf/isqed/2009 db/conf/isqed/isqed2009.html#ZhouYLWK09