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DBLP Record 'conf/isqed/ZhouKALJNS09'

BibTeX

@inproceedings{DBLP:conf/isqed/ZhouKALJNS09,
  author    = {Ying Zhou and
               Rouwaida Kanj and
               Kanak Agarwal and
               Zhuo Li and
               Rajiv V. Joshi and
               Sani R. Nassif and
               Weiping Shi},
  title     = {The impact of BEOL lithography effects on the SRAM cell
               performance and yield},
  booktitle = {ISQED},
  year      = {2009},
  pages     = {607-612},
  ee        = {http://dx.doi.org/10.1109/ISQED.2009.4810363},
  crossref  = {DBLP:conf/isqed/2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2009,
  title     = {10th International Symposium on Quality of Electronic Design
               (ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE},
  year      = {2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2009-04-20 by Michael Ley (ley@uni-trier.de)