BibTeX
@inproceedings{DBLP:conf/isqed/ZhouKALJNS09,
author = {Ying Zhou and
Rouwaida Kanj and
Kanak Agarwal and
Zhuo Li and
Rajiv V. Joshi and
Sani R. Nassif and
Weiping Shi},
title = {The impact of BEOL lithography effects on the SRAM cell
performance and yield},
booktitle = {ISQED},
year = {2009},
pages = {607-612},
ee = {http://dx.doi.org/10.1109/ISQED.2009.4810363},
crossref = {DBLP:conf/isqed/2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2009,
title = {10th International Symposium on Quality of Electronic Design
(ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
booktitle = {ISQED},
publisher = {IEEE},
year = {2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-04-20 by Michael Ley (ley@uni-trier.de)