@inproceedings{DBLP:conf/isqed/YuCZWYB12,
  author    = {Li Yu and
               Wen-Yao Chang and
               Kewei Zuo and
               Jean Wang and
               Douglas Yu and
               Duane S. Boning},
  title     = {Methodology for analysis of TSV stress induced transistor
               variation and circuit performance},
  booktitle = {ISQED},
  year      = {2012},
  pages     = {216-222},
  ee        = {http://dx.doi.org/10.1109/ISQED.2012.6187497},
  crossref  = {DBLP:conf/isqed/2012},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2012,
  editor    = {Keith A. Bowman and
               Kamesh V. Gadepally and
               Pallab Chatterjee and
               Mark M. Budnik and
               Lalitha Immaneni},
  title     = {Thirteenth International Symposium on Quality Electronic
               Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012},
  booktitle = {ISQED},
  publisher = {IEEE},
  year      = {2012},
  isbn      = {978-1-4673-1034-5},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6182938},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}