BibTeX record conf/isqed/WangCC13

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@inproceedings{DBLP:conf/isqed/WangCC13,
  author       = {Zheng Wang and
                  Chao Chen and
                  Anupam Chattopadhyay},
  title        = {Fast reliability exploration for embedded processors via high-level
                  fault injection},
  booktitle    = {International Symposium on Quality Electronic Design, {ISQED} 2013,
                  Santa Clara, CA, USA, March 4-6, 2013},
  pages        = {265--272},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ISQED.2013.6523621},
  doi          = {10.1109/ISQED.2013.6523621},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/WangCC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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