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BibTeX record conf/isqed/UbarMRJ10
@inproceedings{DBLP:conf/isqed/UbarMRJ10, author = {Raimund Ubar and Dmitri Mironov and Jaan Raik and Artur Jutman}, title = {Structural fault collapsing by superposition of BDDs for test generation in digital circuits}, booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED} 2010), 22-24 March 2010, San Jose, CA, {USA}}, pages = {250--257}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/ISQED.2010.5450451}, doi = {10.1109/ISQED.2010.5450451}, timestamp = {Sun, 25 Oct 2020 22:55:58 +0100}, biburl = {https://dblp.org/rec/conf/isqed/UbarMRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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