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BibTeX record conf/isqed/TuanLKT11
@inproceedings{DBLP:conf/isqed/TuanLKT11, author = {Tim Tuan and Austin Lesea and Chris Kingsley and Steven Trimberger}, title = {Analysis of within-die process variation in 65nm FPGAs}, booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011}, pages = {716--720}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/ISQED.2011.5770808}, doi = {10.1109/ISQED.2011.5770808}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isqed/TuanLKT11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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