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DBLP Record 'conf/isqed/SwahnH06'

BibTeX

@inproceedings{DBLP:conf/isqed/SwahnH06,
  author    = {Brian Swahn and
               Soha Hassoun},
  title     = {METS: A Metric for Electro-Thermal Sensitivity, and Its
               Application To FinFETs},
  booktitle = {ISQED},
  year      = {2006},
  pages     = {121-126},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.86},
  crossref  = {DBLP:conf/isqed/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2006,
  title     = {7th International Symposium on Quality of Electronic Design
               (ISQED 2006), 27-29 March 2006, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2523-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2006-05-29 by Michael Ley (ley@uni-trier.de)