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@inproceedings{DBLP:conf/isqed/Suehle02,
author = {John S. Suehle},
title = {Ultra-thin Gate Oxide Reliability and Implications for Design
(Tutorial Abstract)},
booktitle = {ISQED},
year = {2002},
pages = {9},
ee = {http://computer.org/proceedings/isqed/1561/15610009.pdf},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-07-02 by Michael Ley (ley@uni-trier.de)