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DBLP Record 'conf/isqed/Suehle02'

BibTeX

@inproceedings{DBLP:conf/isqed/Suehle02,
  author    = {John S. Suehle},
  title     = {Ultra-thin Gate Oxide Reliability and Implications for Design
               (Tutorial Abstract)},
  booktitle = {ISQED},
  year      = {2002},
  pages     = {9},
  ee        = {http://computer.org/proceedings/isqed/1561/15610009.pdf},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2002-07-02 by Michael Ley (ley@uni-trier.de)