BibTeX
@inproceedings{DBLP:conf/isqed/SenguptaSDKMC04,
author = {Manidip Sengupta and
Sharad Saxena and
Lidia Daldoss and
Glen Kramer and
Sean Minehane and
Jianjun Cheng},
title = {Application Specific Worst Case Corners Using Response Surfaces
and Statistical Models},
booktitle = {ISQED},
year = {2004},
pages = {351-356},
ee = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930351abs.htm},
crossref = {DBLP:conf/isqed/2004},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2004,
title = {5th International Symposium on Quality of Electronic Design
(ISQED 2004), 22-24 March 2004, San Jose, CA, USA},
booktitle = {ISQED},
publisher = {IEEE Computer Society},
year = {2004},
isbn = {0-7695-2093-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-06-21 by Michael Ley (ley@uni-trier.de)