Takashi Sato Takumi Uezono Shiho Hagiwara Kenichi Okada Shuhei Amakawa Noriaki Nakayama Kazuya Masu A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. 21-26 2007 conf/isqed/2007 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.17 db/conf/isqed/isqed2007.html#SatoUHOANM07