How Circuit Analysis and Yield Optimization Can Be Used To Detect Circuit Limitations Before Silicon Results.

Carlo Roma Pierluigi Daglio Guido De Sandre Marco Pasotti Marco Poles How Circuit Analysis and Yield Optimization Can Be Used To Detect Circuit Limitations Before Silicon Results. 107-112 2005 conf/isqed/2005 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.62 db/conf/isqed/isqed2005.html#RomaDSPP05