OhHGGZKP04'

BibTeX

@inproceedings{DBLP:conf/isqed/OhHGGZKP04,
  author    = {Chanhee Oh and
               Haldun Haznedar and
               Martin Gall and
               Amir Grinshpon and
               Vladimir Zolotov and
               Pon Sung Ku and
               Rajendran Panda},
  title     = {A Methodology for Chip-Level Electromigration Risk Assessment
               and Product Qualification},
  booktitle = {ISQED},
  year      = {2004},
  pages     = {232-237},
  ee        = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930232abs.htm},
  crossref  = {DBLP:conf/isqed/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2004,
  title     = {5th International Symposium on Quality of Electronic Design
               (ISQED 2004), 22-24 March 2004, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2093-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}