BibTeX record conf/isqed/OSullivanLG13

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@inproceedings{DBLP:conf/isqed/OSullivanLG13,
  author       = {Conor O'Sullivan and
                  Peter M. Levine and
                  Siddharth Garg},
  title        = {Vertically-addressed test structures {(VATS)} for 3D {IC} variability
                  and stress measurements},
  booktitle    = {International Symposium on Quality Electronic Design, {ISQED} 2013,
                  Santa Clara, CA, USA, March 4-6, 2013},
  pages        = {96--103},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ISQED.2013.6523596},
  doi          = {10.1109/ISQED.2013.6523596},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/OSullivanLG13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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