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BibTeX record conf/isqed/NoguchiOTKYK11
@inproceedings{DBLP:conf/isqed/NoguchiOTKYK11, author = {Hiroki Noguchi and Shunsuke Okumura and Tomoya Takagi and Koji Kugata and Masahiko Yoshimoto and Hiroshi Kawaguchi}, title = {0.45-V operating Vt-variation tolerant 9T/18T dual-port {SRAM}}, booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011}, pages = {219--222}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/ISQED.2011.5770728}, doi = {10.1109/ISQED.2011.5770728}, timestamp = {Mon, 11 Mar 2024 15:42:29 +0100}, biburl = {https://dblp.org/rec/conf/isqed/NoguchiOTKYK11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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