BibTeX record: conf/isqed/MohantyVK06

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@inproceedings{DBLP:conf/isqed/MohantyVK06,
  author    = {Saraju P. Mohanty and
               Ramakrishna Velagapudi and
               Elias Kougianos},
  title     = {Dual-K Versus Dual-T Technique for Gate Leakage Reduction : {A} Comparative
               Perspective},
  booktitle = {7th International Symposium on Quality of Electronic Design {(ISQED}
               2006), 27-29 March 2006, San Jose, CA, {USA}},
  year      = {2006},
  pages     = {564--569},
  crossref  = {DBLP:conf/isqed/2006},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.52},
  doi       = {10.1109/ISQED.2006.52},
  timestamp = {Sat, 20 Sep 2014 08:18:29 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/MohantyVK06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/isqed/2006,
  title     = {7th International Symposium on Quality of Electronic Design {(ISQED}
               2006), 27-29 March 2006, San Jose, CA, {USA}},
  year      = {2006},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-2523-7},
  timestamp = {Sat, 20 Sep 2014 08:18:29 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/2006},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}