DBLP Record 'conf/isqed/MaLZHZLC09'

BibTeX

@inproceedings{DBLP:conf/isqed/MaLZHZLC09,
  author    = {Chenyue Ma and
               Bo Li and
               Lining Zhang and
               Jin He and
               Xing Zhang and
               Xinnan Lin and
               Mansun Chan},
  title     = {A unified FinFET reliability model including high K gate
               stack dynamic threshold voltage, hot carrier injection,
               and negative bias temperature instability},
  booktitle = {ISQED},
  year      = {2009},
  pages     = {7-12},
  ee        = {http://dx.doi.org/10.1109/ISQED.2009.4810262},
  crossref  = {DBLP:conf/isqed/2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2009,
  title     = {10th International Symposium on Quality of Electronic Design
               (ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE},
  year      = {2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}