BibTeX
@inproceedings{DBLP:conf/isqed/LiuTK08,
author = {Zhiyu Liu and
Sherif A. Tawfik and
Volkan Kursun},
title = {Statistical Data Stability and Leakage Evaluation of FinFET
SRAM Cells with Dynamic Threshold Voltage Tuning under Process
Parameter Fluctuations},
booktitle = {ISQED},
year = {2008},
pages = {305-310},
ee = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.97},
crossref = {DBLP:conf/isqed/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2008,
title = {9th International Symposium on Quality of Electronic Design
(ISQED 2008), 17-19 March 2008, San Jose, CA, USA},
booktitle = {ISQED},
publisher = {IEEE Computer Society},
year = {2008},
isbn = {978-0-7695-3117-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-08-29 by Michael Ley (ley@uni-trier.de)