BibTeX record conf/isqed/LiuCWHLCLC22

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@inproceedings{DBLP:conf/isqed/LiuCWHLCLC22,
  author       = {Shi{-}Tang Liu and
                  Jia{-}Xian Chen and
                  Yu{-}Tsung Wu and
                  Chao{-}Ho Hsieh and
                  Chien{-}Mo James Li and
                  Norman Chang and
                  Ying{-}Shiun Li and
                  Wentze Chuang},
  title        = {Low-IR-Drop Test Pattern Regeneration Using {A} Fast Predictor},
  booktitle    = {23rd International Symposium on Quality Electronic Design, {ISQED}
                  2022, Santa Clara, CA, USA, April 6-7, 2022},
  pages        = {27--32},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ISQED54688.2022.9806245},
  doi          = {10.1109/ISQED54688.2022.9806245},
  timestamp    = {Mon, 04 Jul 2022 17:06:19 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/LiuCWHLCLC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}