BibTeX record conf/isqed/LiuBSZ19

download as .bib file

@inproceedings{DBLP:conf/isqed/LiuBSZ19,
  author       = {Xu Liu and
                  Alessandro Bernardini and
                  Ulf Schlichtmann and
                  Xing Zhou},
  title        = {A Compact Model of Negative Bias Temperature Instability Suitable
                  for Gate-Level Circuit Simulation},
  booktitle    = {20th International Symposium on Quality Electronic Design, {ISQED}
                  2019, Santa Clara, CA, USA, March 6-7, 2019},
  pages        = {76--80},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ISQED.2019.8697494},
  doi          = {10.1109/ISQED.2019.8697494},
  timestamp    = {Tue, 29 Dec 2020 18:34:36 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/LiuBSZ19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.