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BibTeX record conf/isqed/LiuBSZ19
@inproceedings{DBLP:conf/isqed/LiuBSZ19, author = {Xu Liu and Alessandro Bernardini and Ulf Schlichtmann and Xing Zhou}, title = {A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation}, booktitle = {20th International Symposium on Quality Electronic Design, {ISQED} 2019, Santa Clara, CA, USA, March 6-7, 2019}, pages = {76--80}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ISQED.2019.8697494}, doi = {10.1109/ISQED.2019.8697494}, timestamp = {Tue, 29 Dec 2020 18:34:36 +0100}, biburl = {https://dblp.org/rec/conf/isqed/LiuBSZ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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