Ju-Yueh Lee Yu Hu Rupak Majumdar Lei He Simultaneous test pattern compaction, ordering and X-filling for testing power reduction. 702-707 2009 ISQED http://dx.doi.org/10.1109/ISQED.2009.4810379 conf/isqed/2009 db/conf/isqed/isqed2009.html#LeeHMH09