BibTeX record conf/isqed/LeeHMH09

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@inproceedings{DBLP:conf/isqed/LeeHMH09,
  author       = {Ju{-}Yueh Lee and
                  Yu Hu and
                  Rupak Majumdar and
                  Lei He},
  title        = {Simultaneous test pattern compaction, ordering and X-filling for testing
                  power reduction},
  booktitle    = {10th International Symposium on Quality of Electronic Design {(ISQED}
                  2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages        = {702--707},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISQED.2009.4810379},
  doi          = {10.1109/ISQED.2009.4810379},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/LeeHMH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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