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BibTeX record conf/isqed/KuzmiczPRU01
@inproceedings{DBLP:conf/isqed/KuzmiczPRU01, author = {Wieslaw Kuzmicz and Witold A. Pleskacz and Jaan Raik and Raimund Ubar}, title = {Defect-Oriented Fault Simulation and Test Generation in Digital Circuits}, booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED} 2001), 26-28 March 2001, San Jose, CA, {USA}}, pages = {365--371}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/ISQED.2001.915257}, doi = {10.1109/ISQED.2001.915257}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/KuzmiczPRU01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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