BibTeX record: conf/isqed/KonouraMHO10

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@inproceedings{DBLP:conf/isqed/KonouraMHO10,
  author    = {Hiroaki Konoura and
               Yukio Mitsuyama and
               Masanori Hashimoto and
               Takao Onoye},
  title     = {Comparative study on delay degrading estimation due to {NBTI} with
               circuit/instance/transistor-level stress probability consideration.},
  booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED}
               2010), 22-24 March 2010, San Jose, CA, {USA}},
  year      = {2010},
  pages     = {646--651},
  crossref  = {DBLP:conf/isqed/2010},
  url       = {http://dx.doi.org/10.1109/ISQED.2010.5450508},
  doi       = {10.1109/ISQED.2010.5450508},
  timestamp = {Tue, 02 Sep 2014 21:15:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/KonouraMHO10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/isqed/2010,
  title     = {11th International Symposium on Quality of Electronic Design {(ISQED}
               2010), 22-24 March 2010, San Jose, CA, {USA}},
  year      = {2010},
  publisher = {{IEEE}},
  isbn      = {978-1-4244-6455-5},
  timestamp = {Tue, 02 Sep 2014 21:15:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/2010},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}