BibTeX record conf/isqed/KimLKIYKPK06

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@inproceedings{DBLP:conf/isqed/KimLKIYKPK06,
  author       = {Young{-}Gu Kim and
                  Sang{-}Hoon Lee and
                  Dae{-}Han Kim and
                  Jae{-}Woo Im and
                  Sung{-}Eun Yu and
                  Dae{-}Wook Kim and
                  Young{-}Kwan Park and
                  Jeong{-}Taek Kong},
  title        = {Sensing Margin Analysis of {MLC} Flash Memories Using a Novel Unified
                  Statistical Model},
  booktitle    = {7th International Symposium on Quality of Electronic Design {(ISQED}
                  2006), 27-29 March 2006, San Jose, CA, {USA}},
  pages        = {185--189},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ISQED.2006.113},
  doi          = {10.1109/ISQED.2006.113},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/KimLKIYKPK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}