The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era.

Young-Gu Kim Soo-Hwan Kim Hoon Lim Sanghoon Lee Keun-Ho Lee Young-Kwan Park Moon-Hyun Yoo The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. 369-372 2008 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.108 conf/isqed/2008 db/conf/isqed/isqed2008.html#KimKLLLPY08