BibTeX record conf/isqed/KaurSKM22

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@inproceedings{DBLP:conf/isqed/KaurSKM22,
  author       = {Arshdeep Kaur and
                  Sayandeep Saha and
                  Chandan Karfa and
                  Debdeep Mukhopadhyay},
  title        = {Corruption Exposes You: Statistical Key Recovery from Compound Logic
                  Locking},
  booktitle    = {23rd International Symposium on Quality Electronic Design, {ISQED}
                  2022, Santa Clara, CA, USA, April 6-7, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ISQED54688.2022.9806219},
  doi          = {10.1109/ISQED54688.2022.9806219},
  timestamp    = {Mon, 04 Jul 2022 17:06:20 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/KaurSKM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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