Aditya P. Karmarkar Xiaopeng Xu Victor Moroz Greg Rollins Xiao Lin Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology. 185-189 2009 ISQED http://dx.doi.org/10.1109/ISQED.2009.4810291 conf/isqed/2009 db/conf/isqed/isqed2009.html#KarmarkarXMRL09