Rouwaida Kanj Rajiv V. Joshi Jayakumaran Sivagnaname Jente B. Kuang Dhruva Acharyya Tuyet Nguyen Chandler McDowell Sani R. Nassif Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. 33-40 2007 conf/isqed/2007 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.83 db/conf/isqed/isqed2007.html#KanjJSKANMN07