KanjJSKANMN07'

BibTeX

@inproceedings{DBLP:conf/isqed/KanjJSKANMN07,
  author    = {Rouwaida Kanj and
               Rajiv V. Joshi and
               Jayakumaran Sivagnaname and
               Jente B. Kuang and
               Dhruva Acharyya and
               Tuyet Nguyen and
               Chandler McDowell and
               Sani R. Nassif},
  title     = {Gate Leakage Effects on Yield and Design Considerations
               of PD/SOI SRAM Designs},
  booktitle = {ISQED},
  year      = {2007},
  pages     = {33-40},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.83},
  crossref  = {DBLP:conf/isqed/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2007,
  title     = {8th International Symposium on Quality of Electronic Design
               (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE Computer Society},
  year      = {2007},
  isbn      = {978-0-7695-2795-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}