Statistical yield analysis of silicon-on-insulator embedded DRAM.

Rouwaida Kanj Rajiv V. Joshi Jente B. Kuang J. Kim Mesut Meterelliyoz William R. Reohr Sani R. Nassif Kevin J. Nowka Statistical yield analysis of silicon-on-insulator embedded DRAM. 190-194 2009 ISQED http://dx.doi.org/10.1109/ISQED.2009.4810292 conf/isqed/2009 db/conf/isqed/isqed2009.html#KanjJKKMRNN09