DBLP Record 'conf/isqed/KanjJKKMRNN09'

BibTeX

@inproceedings{DBLP:conf/isqed/KanjJKKMRNN09,
  author    = {Rouwaida Kanj and
               Rajiv V. Joshi and
               Jente B. Kuang and
               J. Kim and
               Mesut Meterelliyoz and
               William R. Reohr and
               Sani R. Nassif and
               Kevin J. Nowka},
  title     = {Statistical yield analysis of silicon-on-insulator embedded
               DRAM},
  booktitle = {ISQED},
  year      = {2009},
  pages     = {190-194},
  ee        = {http://dx.doi.org/10.1109/ISQED.2009.4810292},
  crossref  = {DBLP:conf/isqed/2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2009,
  title     = {10th International Symposium on Quality of Electronic Design
               (ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE},
  year      = {2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}