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BibTeX record conf/isqed/KanjJKKMRNN09
@inproceedings{DBLP:conf/isqed/KanjJKKMRNN09, author = {Rouwaida Kanj and Rajiv V. Joshi and Jente B. Kuang and J. Kim and Mesut Meterelliyoz and William R. Reohr and Sani R. Nassif and Kevin J. Nowka}, title = {Statistical yield analysis of silicon-on-insulator embedded {DRAM}}, booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED} 2009), 16-18 March 2009, San Jose, CA, {USA}}, pages = {190--194}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/ISQED.2009.4810292}, doi = {10.1109/ISQED.2009.4810292}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/KanjJKKMRNN09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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