BibTeX record conf/isqed/KanjJKKMRNN09

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@inproceedings{DBLP:conf/isqed/KanjJKKMRNN09,
  author       = {Rouwaida Kanj and
                  Rajiv V. Joshi and
                  Jente B. Kuang and
                  J. Kim and
                  Mesut Meterelliyoz and
                  William R. Reohr and
                  Sani R. Nassif and
                  Kevin J. Nowka},
  title        = {Statistical yield analysis of silicon-on-insulator embedded {DRAM}},
  booktitle    = {10th International Symposium on Quality of Electronic Design {(ISQED}
                  2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages        = {190--194},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISQED.2009.4810292},
  doi          = {10.1109/ISQED.2009.4810292},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/KanjJKKMRNN09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}