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BibTeX record conf/isqed/GaoYMD05
@inproceedings{DBLP:conf/isqed/GaoYMD05, author = {Haixia Gao and Yintang Yang and Xiaohua Ma and Gang Dong}, title = {Testing for Resistive Shorts in {FPGA} Interconnects}, booktitle = {6th International Symposium on Quality of Electronic Design {(ISQED} 2005), 21-23 March 2005, San Jose, CA, {USA}}, pages = {159--163}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ISQED.2005.120}, doi = {10.1109/ISQED.2005.120}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/GaoYMD05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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