Benoit Dubois Jean-Baptiste Kammerer Luc Hebrard Francis Braun Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. 53-58 2007 conf/isqed/2007 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.37 db/conf/isqed/isqed2007.html#DuboisKHB07