DuboisKHB07'

BibTeX

@inproceedings{DBLP:conf/isqed/DuboisKHB07,
  author    = {Benoit Dubois and
               Jean-Baptiste Kammerer and
               Luc Hebrard and
               Francis Braun},
  title     = {Analytical Modeling of Hot-Carrier Induced Degradation of
               MOS Transistor for Analog Design for Reliability},
  booktitle = {ISQED},
  year      = {2007},
  pages     = {53-58},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.37},
  crossref  = {DBLP:conf/isqed/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2007,
  title     = {8th International Symposium on Quality of Electronic Design
               (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE Computer Society},
  year      = {2007},
  isbn      = {978-0-7695-2795-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}