BibTeX record conf/isqed/DuanCVKR03

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@inproceedings{DBLP:conf/isqed/DuanCVKR03,
  author       = {F. Duan and
                  R. Castagnetti and
                  R. Venkatraman and
                  O. Kobozeva and
                  S. Ramesh},
  title        = {Design and Use of Memory-Specific Test Structures to Ensure {SRAM}
                  Yield and Manufacturability},
  booktitle    = {4th International Symposium on Quality of Electronic Design {(ISQED}
                  2003), 24-26 March 2003, San Jose, CA, {USA}},
  pages        = {119--124},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ISQED.2003.1194719},
  doi          = {10.1109/ISQED.2003.1194719},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/DuanCVKR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}