A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays.

Nigel Drego Anantha Chandrakasan Duane S. Boning A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays. 281-286 2007 conf/isqed/2007 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.24 db/conf/isqed/isqed2007.html#DregoCB07