BibTeX
@inproceedings{DBLP:conf/isqed/DregoCB07,
author = {Nigel Drego and
Anantha Chandrakasan and
Duane S. Boning},
title = {A Test-Structure to Efficiently Study Threshold-Voltage
Variation in Large MOSFET Arrays},
booktitle = {ISQED},
year = {2007},
pages = {281-286},
ee = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.24},
crossref = {DBLP:conf/isqed/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2007,
title = {8th International Symposium on Quality of Electronic Design
(ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
booktitle = {ISQED},
publisher = {IEEE Computer Society},
year = {2007},
isbn = {978-0-7695-2795-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-05-03 by Michael Ley (ley@uni-trier.de)