BibTeX record conf/isqed/DiasSSTT00

• > Home > conf/isqed/DiasSSTT00

@inproceedings{DBLP:conf/isqed/DiasSSTT00,
  author       = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
                  Jorge Semi{\~{a}}o and
                  Marcelino B. Santos and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Quality of Electronic Design: From Architectural Level to Test Coverage},
  booktitle    = {1st International Symposium on Quality of Electronic Design {(ISQED}
                  2000), 20-22 March 2000, San Jose, CA, {USA}},
  pages        = {197},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ISQED.2000.838874},
  doi          = {10.1109/ISQED.2000.838874},
  timestamp    = {Tue, 07 May 2024 20:06:32 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/DiasSSTT00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}