Harmander Deogun Dennis Sylvester David Blaauw Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate. 175-180 2005 conf/isqed/2005 ISQED http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.61 db/conf/isqed/isqed2005.html#DeogunSB05