BibTeX record conf/isqed/Clement02

download as .bib file

@inproceedings{DBLP:conf/isqed/Clement02,
  author       = {J. Joseph Clement},
  title        = {Electromigration Reliability Issues in High-Performance Circuit Design
                  (Tutorial Abstract)},
  booktitle    = {3rd International Symposium on Quality of Electronic Design, {ISQED}
                  2002, San Jose, CA, USA, March 18-21, 2002},
  pages        = {8},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/Clement02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.