BibTeX record conf/isqed/ChoKKPLCT07

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@inproceedings{DBLP:conf/isqed/ChoKKPLCT07,
  author       = {Choongyeun Cho and
                  Daeik D. Kim and
                  Jonghae Kim and
                  Jean{-}Olivier Plouchart and
                  Daihyun Lim and
                  Sangyeun Cho and
                  Robert Trzcinski},
  title        = {A Data-Driven Statistical Approach to Analyzing Process Variation
                  in 65nm {SOI} Technology},
  booktitle    = {8th International Symposium on Quality of Electronic Design {(ISQED}
                  2007), 26-28 March 2007, San Jose, CA, {USA}},
  pages        = {699--702},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISQED.2007.8},
  doi          = {10.1109/ISQED.2007.8},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/ChoKKPLCT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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