BibTeX record conf/isqed/ChenTCWL09

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@inproceedings{DBLP:conf/isqed/ChenTCWL09,
  author       = {Jone F. Chen and
                  Kuen{-}Shiuan Tian and
                  Shiang{-}Yu Chen and
                  Kuo{-}Ming Wu and
                  C. M. Liu},
  title        = {Effect of {NDD} dosage on hot-carrier reliability in {DMOS} transistors},
  booktitle    = {10th International Symposium on Quality of Electronic Design {(ISQED}
                  2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages        = {226--229},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISQED.2009.4810298},
  doi          = {10.1109/ISQED.2009.4810298},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/ChenTCWL09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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