BickfordHGMJK10'

@inproceedings{DBLP:conf/isqed/BickfordHGMJK10,
  author    = {Jeanne Bickford and
               Nazmul Habib and
               John Goss and
               Robert McMahon and
               Rajiv V. Joshi and
               Rouwaida Kanj},
  title     = {Use of scalable Parametric Measurement Macro to improve
               semiconductor technology characterization and product test},
  booktitle = {ISQED},
  year      = {2010},
  pages     = {315-319},
  ee        = {http://dx.doi.org/10.1109/ISQED.2010.5450445},
  crossref  = {DBLP:conf/isqed/2010},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/isqed/2010,
  title     = {11th International Symposium on Quality of Electronic Design
               (ISQED 2010), 22-24 March 2010, San Jose, CA, USA},
  booktitle = {ISQED},
  publisher = {IEEE},
  year      = {2010},
  isbn      = {978-1-4244-6455-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}