BibTeX record: conf/isqed/BickfordHGMJK10

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@inproceedings{DBLP:conf/isqed/BickfordHGMJK10,
  author    = {Jeanne Bickford and
               Nazmul Habib and
               John Goss and
               Robert McMahon and
               Rajiv V. Joshi and
               Rouwaida Kanj},
  title     = {Use of scalable Parametric Measurement Macro to improve semiconductor
               technology characterization and product test},
  booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED}
               2010), 22-24 March 2010, San Jose, CA, {USA}},
  year      = {2010},
  pages     = {315--319},
  crossref  = {DBLP:conf/isqed/2010},
  url       = {http://dx.doi.org/10.1109/ISQED.2010.5450445},
  doi       = {10.1109/ISQED.2010.5450445},
  timestamp = {Sun, 26 Oct 2014 09:33:58 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/BickfordHGMJK10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/isqed/2010,
  title     = {11th International Symposium on Quality of Electronic Design {(ISQED}
               2010), 22-24 March 2010, San Jose, CA, {USA}},
  year      = {2010},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5443864},
  isbn      = {978-1-4244-6455-5},
  timestamp = {Sun, 26 Oct 2014 09:33:58 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/2010},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}