BibTeX record: conf/isqed/BickfordHBKMPS06

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@inproceedings{DBLP:conf/isqed/BickfordHBKMPS06,
  author    = {Jeanne Bickford and
               Jason Hibbeler and
               Markus B{\"{u}}hler and
               J{\"{u}}rgen Koehl and
               Dirk M{\"{u}}ller and
               Sven Peyer and
               Christian Schulte},
  title     = {Yield Improvement by Local Wiring Redundancy},
  booktitle = {7th International Symposium on Quality of Electronic Design {(ISQED}
               2006), 27-29 March 2006, San Jose, CA, {USA}},
  year      = {2006},
  pages     = {473--478},
  crossref  = {DBLP:conf/isqed/2006},
  url       = {http://dx.doi.org/10.1109/ISQED.2006.148},
  doi       = {10.1109/ISQED.2006.148},
  timestamp = {Fri, 24 Oct 2014 20:10:47 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/BickfordHBKMPS06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/isqed/2006,
  title     = {7th International Symposium on Quality of Electronic Design {(ISQED}
               2006), 27-29 March 2006, San Jose, CA, {USA}},
  year      = {2006},
  publisher = {{IEEE} Computer Society},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10740},
  isbn      = {0-7695-2523-7},
  timestamp = {Fri, 24 Oct 2014 20:10:47 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isqed/2006},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}