BibTeX record conf/isqed/AxelradCODDGSBB00

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@inproceedings{DBLP:conf/isqed/AxelradCODDGSBB00,
  author       = {Valery Axelrad and
                  Nicolas B. Cobb and
                  M. O'Brien and
                  Thuy Do and
                  Tom Donnelly and
                  Yuri Granik and
                  Emile Y. Sahouria and
                  Victor Boksha and
                  Artur Balasinski},
  title        = {Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected {VLSI}
                  Designs},
  booktitle    = {1st International Symposium on Quality of Electronic Design {(ISQED}
                  2000), 20-22 March 2000, San Jose, CA, {USA}},
  pages        = {461--466},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ISQED.2000.838922},
  doi          = {10.1109/ISQED.2000.838922},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/AxelradCODDGSBB00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}