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BibTeX record conf/isqed/AlamJPJ09
@inproceedings{DBLP:conf/isqed/AlamJPJ09, author = {Syed M. Alam and Robert E. Jones and Scott Pozder and Ankur Jain}, title = {Die/wafer stacking with reciprocal design symmetry {(RDS)} for mask reuse in three-dimensional {(3D)} integration technology}, booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED} 2009), 16-18 March 2009, San Jose, CA, {USA}}, pages = {569--575}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/ISQED.2009.4810357}, doi = {10.1109/ISQED.2009.4810357}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/AlamJPJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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