BibTeX
@inproceedings{DBLP:conf/isqed/AlamJPJ09,
author = {Syed M. Alam and
Robert E. Jones and
Scott Pozder and
Ankur Jain},
title = {Die/wafer stacking with reciprocal design symmetry (RDS)
for mask reuse in three-dimensional (3D) integration technology},
booktitle = {ISQED},
year = {2009},
pages = {569-575},
ee = {http://dx.doi.org/10.1109/ISQED.2009.4810357},
crossref = {DBLP:conf/isqed/2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/isqed/2009,
title = {10th International Symposium on Quality of Electronic Design
(ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
booktitle = {ISQED},
publisher = {IEEE},
year = {2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-04-20 by Michael Ley (ley@uni-trier.de)