BibTeX record conf/isocc/LimKKK20

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@inproceedings{DBLP:conf/isocc/LimKKK20,
  author       = {Hyeonchan Lim and
                  Tae Hyun Kim and
                  Seunghwan Kim and
                  Sungho Kang},
  title        = {Diagnosis of Scan Chain Faults Based-on Machine-Learning},
  booktitle    = {International SoC Design Conference, {ISOCC} 2020, Yeosu, South Korea,
                  October 21-24, 2020},
  pages        = {57--58},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ISOCC50952.2020.9333074},
  doi          = {10.1109/ISOCC50952.2020.9333074},
  timestamp    = {Mon, 15 Jul 2024 22:17:08 +0200},
  biburl       = {https://dblp.org/rec/conf/isocc/LimKKK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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